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Moisture diffusion along the TiN/SiO2 interface and in plasma-enhanced chemical vapor deposited SiO2
XU G., CLARKE D.R., MA Q., FUJIMOTO H.
itemdescription
TitleMoisture diffusion along the TiN/SiO2 interface and in plasma-enhanced chemical vapor deposited SiO2
AuthorsXU G., CLARKE D.R., MA Q., FUJIMOTO H.
Data nameJournal of Applied Physics
Volume88
Num6
Page3695-3698
Year2000
PublisherAmerican Institute of Physics
LanguageEN
Abstract languageEN
ISSN218979
@idhttps://gbank.gsj.jp/ld/resource/geolis/200008508