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Application of scanning X-ray analytical microscope to the petrographic characterization of a ductile shear zone: an alternative method to image microstructures
MICHIBAYASHI K., TOGAMI S., TAKANO M., KUMAZAWA M., KAGEYAMA T.
itemdescription
TitleApplication of scanning X-ray analytical microscope to the petrographic characterization of a ductile shear zone: an alternative method to image microstructures
AuthorsMICHIBAYASHI K., TOGAMI S., TAKANO M., KUMAZAWA M., KAGEYAMA T.
Data nameTectonophysics
Volume310
Num1-4
Page55-67
Year1999
PublisherElsevier Science B.V.
LanguageEN
Abstract languageEN
ISSN00401951
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=199910004
DOI10.1016/S0040-1951(99)00153-5
@idhttps://gbank.gsj.jp/ld/resource/geolis/199910004