Geological Literature
FIB/HVEM observation of the configuration of cracks and the defect structure near the cracks in Si
SAKA H., ABE S.
| item | description |
|---|---|
| Title | FIB/HVEM observation of the configuration of cracks and the defect structure near the cracks in Si |
| Authors | SAKA H., ABE S. |
| Data name | Journal of Electron Microscopy |
| Volume | 46 |
| Num | 1 |
| Page | 45-57 |
| Year | 1997 |
| Publisher | Japanese Society of Electron Microscopy |
| Language | EN |
| Abstract language | EN |
| ISSN | 00220744 |
| @id | https://gbank.gsj.jp/ld/resource/geolis/199707020 |