Geological Literature
Measurement of light element in silicon using by secondary ion mass spectrometry (abs.)
YUTANI M., HIYAGON H., SUGIURA N., HAMANO Y.
| item | description |
|---|---|
| Title | Measurement of light element in silicon using by secondary ion mass spectrometry (abs.) |
| Authors | YUTANI M., HIYAGON H., SUGIURA N., HAMANO Y. |
| Data name | Abstracts, Japan Earth and Planetary Science Joint Meeting |
| Volume | 1996 |
| Page | 534-534 |
| Year | 1996 |
| Publisher | Seismological Society of Japan, Volcanological Society of Japan, Geodetic Society of Japan, Geochemical Society of Japan, Japan Society for Planetary Science, Japanese Association of Mineralogists, Petrologist and Economic Geologists, Society of Geomagnetism and Earth, Planetary and Space Sciences, Mineralogical Society of Japan, Society of Resource Geology, Japan Association for Quaternary Research |
| Language | JA |
| GEOLIS URL | https://darc.gsj.jp/archives/detail?cls=geolis&pkey=199612521 |
| @id | https://gbank.gsj.jp/ld/resource/geolis/199612521 |