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Analysis of Archean sediments with scanning X-ray analytical microscope (abs.)
YOSHIOKA H., TAKANO M., NAKANO K., KUMAZAWA M., HOSOKAWA Y.
itemdescription
TitleAnalysis of Archean sediments with scanning X-ray analytical microscope (abs.)
AuthorsYOSHIOKA H., TAKANO M., NAKANO K., KUMAZAWA M., HOSOKAWA Y.
Data nameAnnual Meeting of the Geochemical Society of Japan
Volume1994
Page237-237
Year1994
PublisherGeochemical Society of Japan
LanguageJA
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=199508228
@idhttps://gbank.gsj.jp/ld/resource/geolis/199508228