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Isotope analysis by secondary ion mass spectrometry: Analysis with high sensitivity, high spatial resolution and high mass resolution
MORISHITA Yuichi
itemdescription
TitleIsotope analysis by secondary ion mass spectrometry: Analysis with high sensitivity, high spatial resolution and high mass resolution
AuthorsMORISHITA Yuichi
Data nameChishitsu News
Num469
Page33-42
Year1993
PublisherJitsugyo Kohosha
LanguageJA
ISSN00094854
Link
@idhttps://gbank.gsj.jp/ld/resource/geolis/199304300