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Bias dependence of Schottky barrier height in GaAs from internal photoemission and current-voltage characteristics
ISHIDA Toshiki, IKOMA Hideaki
itemdescription
TitleBias dependence of Schottky barrier height in GaAs from internal photoemission and current-voltage characteristics
AuthorsISHIDA Toshiki, IKOMA Hideaki
Data nameJournal of Applied Physics
Volume74
Num6
Page3977-3958
Year1993
PublisherAmerican Institute of Physics
LanguageEN
Abstract languageEN
ISSN00218979
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=199301867
@idhttps://gbank.gsj.jp/ld/resource/geolis/199301867