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Trace and Volatile Element Microanalysis by SIMS (V42B-4)(abs.)
YURIMOTO H., KUROSAWA M., SUENO S.
itemdescription
TitleTrace and Volatile Element Microanalysis by SIMS (V42B-4)(abs.)
AuthorsYURIMOTO H., KUROSAWA M., SUENO S.
Data nameEOS, Transactions, American Geophysical Union
Volume71
Num28
Page961-962
Year1990
PublisherAmerican Geophysical Union
LanguageEN
ISSN00963941
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=199108793
@idhttps://gbank.gsj.jp/ld/resource/geolis/199108793