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Electrical characteristics dependence on aluminum mole fraction in (Al0.5Ga0.5)Sb/InAs/(AlXGa1-X)Sb heterostructure
YOH Kanji, MORIUCHI Toshiaki, YANO Mitsuaki, INOUE Masataka
itemdescription
TitleElectrical characteristics dependence on aluminum mole fraction in (Al0.5Ga0.5)Sb/InAs/(AlXGa1-X)Sb heterostructure
AuthorsYOH Kanji, MORIUCHI Toshiaki, YANO Mitsuaki, INOUE Masataka
Data nameJournal of Crystal Growth, Molecular Beam Epitaxy 1990, Proceedings of the Sixth International Conference on Molecular Beam Epitaxy
Volume111
Num1-4
Page643-646
Year1991
PublisherNorth-Holland
LanguageEN
Abstract languageEN
ISSN00220248
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=199108579
DOI10.1016/0022-0248(91)91056-G
@idhttps://gbank.gsj.jp/ld/resource/geolis/199108579