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High hole mobility in strained Ge channel of modulation-doped p-Si0.5Ge0.5/Ge/Si1-xGex heterostructure
MIYAO Masanobu, MURAKAMI Eiichi, ETOH Hiroyuki, NAKAGAWA Kiyokazu, NISHIDA Akio
itemdescription
TitleHigh hole mobility in strained Ge channel of modulation-doped p-Si0.5Ge0.5/Ge/Si1-xGex heterostructure
AuthorsMIYAO Masanobu, MURAKAMI Eiichi, ETOH Hiroyuki, NAKAGAWA Kiyokazu, NISHIDA Akio
Data nameJournal of Crystal Growth, Molecular Beam Epitaxy 1990, Proceedings of the Sixth International Conference on Molecular Beam Epitaxy
Volume111
Num1-4
Page912-915
Year1991
PublisherNorth-Holland
LanguageEN
Abstract languageEN
ISSN00220248
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=199104053
DOI10.1016/0022-0248(91)91106-K
@idhttps://gbank.gsj.jp/ld/resource/geolis/199104053