Geological Literature
Observation of dark line defects in InGaAs/GaAs strained layer superlattices by photoluminescence topography
IIZUKA Kanji, YOSHIDA Takashi, SUZUKI Toshimasa, HIROSE Haruo
| item | description |
|---|---|
| Title | Observation of dark line defects in InGaAs/GaAs strained layer superlattices by photoluminescence topography |
| Authors | IIZUKA Kanji, YOSHIDA Takashi, SUZUKI Toshimasa, HIROSE Haruo |
| Data name | Journal of Crystal Growth, Molecular Beam Epitaxy 1990, Proceedings of the Sixth International Conference on Molecular Beam Epitaxy |
| Volume | 111 |
| Num | 1-4 |
| Page | 429-433 |
| Year | 1991 |
| Publisher | North-Holland |
| Language | EN |
| Abstract language | EN |
| ISSN | 00220248 |
| GEOLIS URL | https://darc.gsj.jp/archives/detail?cls=geolis&pkey=199101502 |
| DOI | 10.1016/0022-0248(91)91014-2 |
| @id | https://gbank.gsj.jp/ld/resource/geolis/199101502 |