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Surface diffusion length observed by in situ scanning microprobe reflection high-energy electron diffraction
HATA Masayuki, WATANABE Akiyoshi, ISU Toshiro
itemdescription
TitleSurface diffusion length observed by in situ scanning microprobe reflection high-energy electron diffraction
AuthorsHATA Masayuki, WATANABE Akiyoshi, ISU Toshiro
Data nameJournal of Crystal Growth, Molecular Beam Epitaxy 1990, Proceedings of the Sixth International Conference on Molecular Beam Epitaxy
Volume111
Num1-4
Page83-87
Year1991
PublisherNorth-Holland
LanguageEN
Abstract languageEN
ISSN00220248
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=199101031
DOI10.1016/0022-0248(91)90951-Z
@idhttps://gbank.gsj.jp/ld/resource/geolis/199101031