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In Situ X-ray Photoemission Spectroscopy for Atomic Layer Epitaxy of InP and GaAs
KODAMA K., OZEKI M., SAKUMA Y., MOCHIZUKI K., OHTSUKA N.
itemdescription
TitleIn Situ X-ray Photoemission Spectroscopy for Atomic Layer Epitaxy of InP and GaAs
AuthorsKODAMA K., OZEKI M., SAKUMA Y., MOCHIZUKI K., OHTSUKA N.
Data nameJournal of Crystal Growth, Crystal Growth 1989, Part 1, Proceedings of the Ninth International Conference on Crystal Growth
Volume99
Num1-4
Page535-539
Year1990
PublisherNorth-Holland
LanguageEN
Abstract languageEN
ISSN00220248
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=199002355
DOI10.1016/0022-0248(90)90578-9
@idhttps://gbank.gsj.jp/ld/resource/geolis/199002355