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Influence of Substrate Orientation on the Characteristics of Si1-xGex/Si Strained Layers Grown by MBE
ETOH H., MURAKAMI E., ISHIZAKA A., SHIMADA T., MIYAO M.
itemdescription
TitleInfluence of Substrate Orientation on the Characteristics of Si1-xGex/Si Strained Layers Grown by MBE
AuthorsETOH H., MURAKAMI E., ISHIZAKA A., SHIMADA T., MIYAO M.
Data nameJournal of Crystal Growth, Crystal Growth 1989, Part 1, Proceedings of the Ninth International Conference on Crystal Growth
Volume99
Num1-4
Page263-268
Year1990
PublisherNorth-Holland
LanguageEN
Abstract languageEN
ISSN00220248
DOI10.1016/0022-0248(90)90524-O
@idhttps://gbank.gsj.jp/ld/resource/geolis/199000404