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A New Method for the Surface Structure Analysis by X-ray Diffraction
TAKAHASHI Toshi
itemdescription
TitleA New Method for the Surface Structure Analysis by X-ray Diffraction
AuthorsTAKAHASHI Toshi
Data nameSolid State Physics (offprint)
Volume23
Num10
Page780-787
Year1988
Publisherアグネ技術センター
LanguageJA
Abstract languageEN
ISSN04544544
@idhttps://gbank.gsj.jp/ld/resource/geolis/198806643