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The improvement of resolution on the ultrasonic inspection method (1) - The application of wavelet processing and CDP stack -
ASHIDA Yuzuru, OHKAWA Shiro, UMEDO Ariaki
itemdescription
TitleThe improvement of resolution on the ultrasonic inspection method (1) - The application of wavelet processing and CDP stack -
AuthorsASHIDA Yuzuru, OHKAWA Shiro, UMEDO Ariaki
Data nameProceedings of the SEGJ Conference
Volume77
Page69-71
Year1987
PublisherThe Society of Exploration Geophysicists of Japan
LanguageJA
Abstract languageEN
@idhttps://gbank.gsj.jp/ld/resource/geolis/198707338