Geological Literature
二次イオン質量分析計(SIMS)による火山岩・変質岩の分析とその応用(演旨)
高島 勲, TANGOOL W., JARACH W.
item | description |
---|---|
Title | 二次イオン質量分析計(SIMS)による火山岩・変質岩の分析とその応用(演旨) |
AuthorsJ | 高島 勲, TANGOOL W., JARACH W. |
Data name | Journal of the Japanese Association of Mineralogists, Petrologists and Economic Geologists |
Volume | 77 |
Num | 4 |
Page | 149-149 |
Year | 1982 |
Publisher | Japanese Association of Mineralogists, Petrologists and Economic Geologists |
Language | JA |
ISSN | 00214825 |
GEOLIS URL | https://darc.gsj.jp/archives/detail?cls=geolis&pkey=198204657 |
DOI | 10.2465/ganko1941.77.140 |
@id | https://gbank.gsj.jp/ld/resource/geolis/198204657 |