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二次イオン質量分析計(SIMS)による火山岩・変質岩の分析とその応用(演旨)
高島 勲, TANGOOL W., JARACH W.
itemdescription
Title二次イオン質量分析計(SIMS)による火山岩・変質岩の分析とその応用(演旨)
AuthorsJ高島 勲, TANGOOL W., JARACH W.
Data nameJournal of the Japanese Association of Mineralogists, Petrologists and Economic Geologists
Volume77
Num4
Page149-149
Year1982
PublisherJapanese Association of Mineralogists, Petrologists and Economic Geologists
LanguageJA
ISSN00214825
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=198204657
DOI10.2465/ganko1941.77.140
@idhttps://gbank.gsj.jp/ld/resource/geolis/198204657