Display Results of Searched Sample

Sample code : JF-1
Element code : P2O5
Unit : %

value	technique	year	title_of_literature<MAX120col.>	journal<MAX120col.>	vol	page	name<MAX80col.>
0.006	XRF	1985.12	Personal communication, Franklin & Marshall College, Pennsylvania				S.A.Mertzman
0.009	COLOR	1985	Personal communication, Geological Survey of Japan				T.Fujinuki
0.01	COLOR	1987.04	Elemental concentrations in nine new Japanese rock reference samples	Geost. Newsletter	11	75-77	S.Terashima and A.Ando
0.004	COLOR	1987.03	Personal communication, Universitat zu Koln, Germany				H.U.Kasper
0.01	COLOR	1987.07	Personal communication, ETH Inst. Krist. Krist. Petr.,Zurich, Switzerland				B.Ayranci
0.008	COLOR	1987.07	Personal communication, BMG, Philippines				E.M.Macalalad
0.009	XRF	1987.1	XRF analysis of rock samples(in Japanese)	JEOL Application Note		3-18	D.Hogari
0.009	CHEM	1985.1	New standard rock samples, JF-1,JA-2 and JG-2, and their prototype chemical composition(Abst.,in Japanese)	1985 Annual Meet. Japan Geoch. Soc.		159	T.Fujinuki, S.Harayama, O.Ujike, T.Sudo and A.Ando
0.017	XRF	1988.1	Elemental concentrations in Japanese silicate rock standards: A comparison with the literature	Geost. Newsletter	12	379-389	K.W.Sims, E.S.Gladney, C.Lundstrom and N.W.Bower
0.02	COLOR	1988.02	Personal communication, USSR Academy of Sciences Siberian Branch				V.P.Afonin
0.02	XRF	1993.04	XRF and INAA determinations of major and trace elements in geological survey of Japan igneous and sedimentary rock stadards	Geost. Newsletter	17	127-133	R.B.Hallett and
0.007783	COLOR	1993.1	Determination of phosphorous in fifty-nine geochemical reference samples by extractive spectrophotometry	Geost. Newsletter	17	219-222	P.Chattopadhyay
0.01	XRF	1992.12	X-ray Fluprescence Analysis by using Fundamental Parameter Method.	Bull.Institute for advanced Materials Processing Tohoku Univ.	48	140-150	K.Sugiyama,J.W.Essel
0.01	XRF	1992	Feasibility study for chemical analysis by X-ray spectrometer using the fundamental parameter method	High Temperature Materials and Processes	12	167-173	K.Sugiyama, Y.Waseda, J.W.Essel
<0.02	AA	1996	Personal communication, Bremen Univ., Germany				M.Zuther
0.008	XRF	1996	Personal communication, Bremen Univ., Germany				M.Zuther
0.02	XRF	1994	Major, trace and rare-earth elements in fourteen GSJ reference samples. Determination by X-ray fluorescence spectrometry and inductively coupled plasma optical emission spectrometory	Geostandards Newsletter	18	91-100	J.C.Germanique
0.01	ICPES	1994	Major, trace and rare-earth elements in fourteen GSJ reference samples. Determination by X-ray fluorescence spectrometry and inductively coupled plasma optical emission spectrometory	Geostandards Newsletter	18	91-100	J.C.Germanique
0.01	XRF	1996	Major and trace element analysis of fifteen japanese igneous reference rocks by XRFS and INAA	Geostandards Newsletter	20	87-94	John Stix,Michael P.Gorton,Eric Fontaine
0.02	XRF	1998	Personal communication,GEOMAR,Germany				K.Wolf
0.010	XRF	1997	Major and Trace Element Analyses of Silicate Rocks Using X-ray Fluorescence Spectrometer RIX3000	The Rigaku-Denki Journal	28		T.Takahashi and K.Shuto
0.010	XRF	1997	Major and Trace Element Analyses of Silicate Rocks Using X-ray Fluorescence Spectrometer RIX3000	The Rigaku-Denki Journal	28		T.Takahashi and K.Shuto
0.01	XRF	1994	Personal Communication,WSU GeoAnalytical Laboratory, USA				C. Knaack, S. Cornelius and P. Hooper
0.01	XRF	2000	Personarl Communication,Washington State University				D. Johnson