| value | technique | year | title_of_literature<MAX120col.> | journal<MAX120col.> | vol | page | name<MAX80col.> |
|---|
| 0.05 | ICPMS |
1990 | Rapid determination of seven trace elements in rock reference samples by ICP-MS (in Japanese with English abstract) | Bunseki Kagaku | 39 | 55-59 | T.Okai |
| 0.06 | SSMS |
1994 | Trace element analysis of GSJ silicate reference materials:Comparison of SSMS with ICP-MS data and a critical discussion of compiled values | Fresenius.J.Anal.Chem | 350 | 310-318 | K.P.Jochum and G.Jenner |
| 0.044 | ICPMS |
1997 | Determination of As,Bi,Sb,Se and Te in Fifity Five Reference Materials by Hydride Generation ICP-MS | Geostandards Newsletter | 21 | 85-91 | G.E.M.Hall and J.C Pelchat |
| <2 | EXRF |
2002 | Personal Communication, Southern Connecticut State Univ., USA | | | | T. Fleming |
| 0.046 | HAA |
2002 | Determination of bismuth in 50 geological reference materials by AAS | BUNSEKI KAGAKU | 51 | 317-322 | S.Terashima, T.Okai, N.Imai |