value | technique | year | title_of_literature<MAX120col.> | journal<MAX120col.> | vol | page | name<MAX80col.> |
---|---|---|---|---|---|---|---|
22 | XRF | 1983 | Determination of multi elements in sediments by X-ray fluorescence | Annual Rep. Yokohama Res. Inst. for Env. Sci. | 8 | 103-110 | Y.Shirayanagi |
24.4 | AA | 1975.04 | Personal communication, Res. Center Jujo Paper Co. Ltd., Japan | M.Tuchiya | |||
24.07 | XRF | 1975.09 | Personal communicatin, Kochi Pref. Res. Center Env. Prot., Japan | J.Yamamoto | |||
24.3959 | SIMS | 1989.1 | Quantitative SIMS of rock reference samples | Geoch. J. | 23 | 215-236 | H.Yurimoto, A.Yamashita, N.Nishida and S.Sueno |
22.2 | EXRF | 1979 | Multi-element analysis of geological samples by energy-dispersive X-ray fluorescence | Anal. Chim. Acta | 109 | 85-95 | P.Verbeke and F.Adams |
22.8 | PIXE | 1986 | Analysis of geological standards with PIXE and PIGE technioues applications to volcanic rocks | J. Radio. Nuc. Chem., Articles | 102 | 131-141 | I.Brissaud, A.de Chateau-Thierry, J.P.Frontier and |
26.4 | INAA | 1996 | Multi-element determination by a cold neutron-induced prompt gamma-ray analysis | 12 | C.Yonezawa |