| value | technique | year | title_of_literature<MAX120col.> | journal<MAX120col.> | vol | page | name<MAX80col.> |
| 3.0 | XRF |
1997 | XRF Analysis of Major and Trace Elements for Silicate Rocks Using Low Dilution Ratio Fused Glass | HUEPS Technical Report-2 | | 1-20 | R.Tanaka and Y.Orihashi |
| 0.01 | NAA |
1998 | Personal communication,Lucas Heights Science and Technology center ,Australia | | | | H.Waldron |
| 2 | XRF |
1994 | Personal Communication,WSU GeoAnalytical Laboratory, USA | | | | C. Knaack, S. Cornelius and P. Hooper |
| 0.6 | ICPMS |
1994 | Personal Communication,WSU GeoAnalytical Laboratory, USA | | | | C. Knaack, S. Cornelius and P. Hooper |
| 2 | XRF |
2000 | Personarl Communication,Washington State University | | | | D. Johnson |
| 0.6 | ICPMS |
2000 | Personarl Communication,Washington State University | | | | D. Johnson |