value | technique | year | title_of_literature<MAX120col.> | journal<MAX120col.> | vol | page | name<MAX80col.> |
---|---|---|---|---|---|---|---|
3.0 | XRF | 1997 | XRF Analysis of Major and Trace Elements for Silicate Rocks Using Low Dilution Ratio Fused Glass | HUEPS Technical Report-2 | 1-20 | R.Tanaka and Y.Orihashi | |
0.01 | NAA | 1998 | Personal communication,Lucas Heights Science and Technology center ,Australia | H.Waldron | |||
2 | XRF | 1994 | Personal Communication,WSU GeoAnalytical Laboratory, USA | C. Knaack, S. Cornelius and P. Hooper | |||
0.6 | ICPMS | 1994 | Personal Communication,WSU GeoAnalytical Laboratory, USA | C. Knaack, S. Cornelius and P. Hooper | |||
2 | XRF | 2000 | Personarl Communication,Washington State University | D. Johnson | |||
0.6 | ICPMS | 2000 | Personarl Communication,Washington State University | D. Johnson |