| value | technique | year | title_of_literature<MAX120col.> | journal<MAX120col.> | vol | page | name<MAX80col.> |
|---|
| 0.04 | AA |
1987.04 | Elemental concentrations in nine new Japanese rock reference samples | Geost. Newsletter | 11 | 75-77 | S.Terashima and A.Ando |
| <5 | XRF |
1987.05 | Personal communication, Gold Fields Laboratories, Johannesburg, South Africa | | | | Nielsen D., C.J.Van Niekerk, M.B.Forsyth, P.R.Jani |
| 0.028 | SSMS |
1994 | Trace element analysis of GSJ silicate reference materials:Comparison of SSMS with ICP-MS data and a critical discussion of compiled values | Fresenius.J.Anal.Chem | 350 | 310-318 | K.P.Jochum and G.Jenner |
| 1 | XRF |
1996 | Personal communication,Bremen Univ., Germany | | | | M.Zuther |
| 0.023 | INAA |
1996 | A Self-Consistent Compilation of Elemental Concentration Data for 93 Geochemical Reference Samples | Geostandards Newsletter | 20 | 217-245 | Randy L.Korotev |
| 0.03 | ICPMS |
1997 | Determination of As,Bi,Sb,Se and Te in Fifity Five Reference Materials by Hydride Generation ICP-MS | Geostandards Newsletter | 21 | 85-91 | G.E.M.Hall and J.C Pelchat |
| <2 | EXRF |
2002 | Personal Communication, Southern Connecticut State Univ., USA | | | | T. Fleming |