| value | technique | year | title_of_literature<MAX120col.> | journal<MAX120col.> | vol | page | name<MAX80col.> |
|---|
| <0.02 | ICPES |
1989.04 | Personal communication, Geological Survey of Japan | | | | K.Kikkawa |
| 0.02 | XRF |
1990.01 | Personal communication, IFREMER, Centre de Brest, France | | | | J.Etoubleau |
| 0.02 | XRF |
1990.02 | Personal communication, Geological Survey of Canada | | | | D.C.Gregoire |
| 0.01 | CHEM |
1990.04 | Personal communication, Geological Survey of India | | | | B.G.Rao |
| 0.02 | XRF |
1990.04 | Personal communication, Govern. Chem. Lab., Brisbane, Australia | | | | H.A.Olszowy, J.Hegarty, P.Smith, R.Sumner, S.Mckeo |
| <0.05 | XRF |
1990.05 | Personal Communication, U.S. Geological Survey, Lakewood | | | | J.S.Kane, J.G.Crock, D.F.Siems, J.E.Taggart and A. |
| <0.02 | XRF |
1990.05 | Personal Communication, U.S. Geological Survey, Menlo Park | | | | J.S.Kane, B.W.King, J.Kent and D.Y.Vivit |
| <0.03 | ICPES |
1990.05 | Personal Communication, U.S. Geological Survey, Reston | | | | J.S.Kane |
| 0.01 | COLOR |
1990.04 | Elemental concentrations in nine new GSJ rock reference samples 'sedimentary rock series' | Geost. Newsletter | 14 | 1-5 | S.Terashima, A.Ando, T.Okai, Y.Kanai, M.Taniguchi, |
| <0.002 | ICPES |
1990 | Identification of tephra layers by inductively coupled plasma(ICP) emission spectrometry, and their applications (in Japanese with English abstract) | J. Geography | 99 | 11-26 | K.Kikkawa |
| 0.04 | VOLU |
1991.09 | Major and trace elemental abundances of the GSJ sedimentary rock reference samples | J.Japan Assoc.Min. Pet.Econ.Geol | 86 | 432-437 | K.Ishikawa,T.Yoshida and |
| <0.01 | COLOR |
1992 | Personal Communication,Dowa Engineering Co., Ltd.(Anal.Iijima Bunseki Center) | | | | Y.Kinryu |
| 0.020 | CHEM |
1994 | Personal Communication, Czech Geol. surv, Czech Republic | | | | I.Rubeska |
| 0.02 | XRF |
1997 | Major and Trace Element Analyses of Silicate Rocks Using X-ray Fluorescence Spectrometer RIX3000 | The Rigaku-Denki Journal | 28 | | T.Takahashi and K.Shuto |
| 0.016 | XRF |
1997 | Major and Trace Element Analyses of Silicate Rocks Using X-ray Fluorescence Spectrometer RIX3000 | The Rigaku-Denki Journal | 28 | | T.Takahashi and K.Shuto |
| 0.011 | XRF |
1995 | Major and trace element analyses of rock samples by X-ray fluorescence spectrometry using Rh anode tube | Department of Geology, Faculty of Educaton, Iwate University and Institute of Mineralogy, Petrology, and Economic Geology, Tokoku University | 55 | 89-110 | N. Tsuchiya, T. Hasenaka |