value | technique | year | title_of_literature<MAX120col.> | journal<MAX120col.> | vol | page | name<MAX80col.> |
---|---|---|---|---|---|---|---|
<0.02 | ICPES | 1989.04 | Personal communication, Geological Survey of Japan | K.Kikkawa | |||
0.02 | XRF | 1990.01 | Personal communication, IFREMER, Centre de Brest, France | J.Etoubleau | |||
0.02 | XRF | 1990.02 | Personal communication, Geological Survey of Canada | D.C.Gregoire | |||
0.01 | CHEM | 1990.04 | Personal communication, Geological Survey of India | B.G.Rao | |||
0.02 | XRF | 1990.04 | Personal communication, Govern. Chem. Lab., Brisbane, Australia | H.A.Olszowy, J.Hegarty, P.Smith, R.Sumner, S.Mckeo | |||
<0.05 | XRF | 1990.05 | Personal Communication, U.S. Geological Survey, Lakewood | J.S.Kane, J.G.Crock, D.F.Siems, J.E.Taggart and A. | |||
<0.02 | XRF | 1990.05 | Personal Communication, U.S. Geological Survey, Menlo Park | J.S.Kane, B.W.King, J.Kent and D.Y.Vivit | |||
<0.03 | ICPES | 1990.05 | Personal Communication, U.S. Geological Survey, Reston | J.S.Kane | |||
0.01 | COLOR | 1990.04 | Elemental concentrations in nine new GSJ rock reference samples 'sedimentary rock series' | Geost. Newsletter | 14 | 1-5 | S.Terashima, A.Ando, T.Okai, Y.Kanai, M.Taniguchi, |
<0.002 | ICPES | 1990 | Identification of tephra layers by inductively coupled plasma(ICP) emission spectrometry, and their applications (in Japanese with English abstract) | J. Geography | 99 | 11-26 | K.Kikkawa |
0.04 | VOLU | 1991.09 | Major and trace elemental abundances of the GSJ sedimentary rock reference samples | J.Japan Assoc.Min. Pet.Econ.Geol | 86 | 432-437 | K.Ishikawa,T.Yoshida and |
<0.01 | COLOR | 1992 | Personal Communication,Dowa Engineering Co., Ltd.(Anal.Iijima Bunseki Center) | Y.Kinryu | |||
0.020 | CHEM | 1994 | Personal Communication, Czech Geol. surv, Czech Republic | I.Rubeska | |||
0.02 | XRF | 1997 | Major and Trace Element Analyses of Silicate Rocks Using X-ray Fluorescence Spectrometer RIX3000 | The Rigaku-Denki Journal | 28 | T.Takahashi and K.Shuto | |
0.016 | XRF | 1997 | Major and Trace Element Analyses of Silicate Rocks Using X-ray Fluorescence Spectrometer RIX3000 | The Rigaku-Denki Journal | 28 | T.Takahashi and K.Shuto | |
0.011 | XRF | 1995 | Major and trace element analyses of rock samples by X-ray fluorescence spectrometry using Rh anode tube | Department of Geology, Faculty of Educaton, Iwate University and Institute of Mineralogy, Petrology, and Economic Geology, Tokoku University | 55 | 89-110 | N. Tsuchiya, T. Hasenaka |