value | technique | year | title_of_literature<MAX120col.> | journal<MAX120col.> | vol | page | name<MAX80col.> |
---|---|---|---|---|---|---|---|
0.28 | NAA | 1979.02 | Personal communication, Nihon Inspection Ltd., Tokyo Res. Center, Japan | Y.Saito | |||
0.0546 | IDMS | 1985.1 | Determination of Ga,In,Tl and Ti by mass spectrometry(Abst.) | 1985 Annual Meet. Japan Geoch. Soc. | 161 | T.Saito, H.Shimizu and A.Masuda | |
0.0529 | RNAA | 1987.1 | Rapid determination of trace indium in silicate samples by epithernal neutron activation analysis(Abst.) | 31 Symp. Radioch. | 130-131 | M.Ebihara, A.Nemoto and | |
0.068 | INAA | 1987.1 | Rapid determination of trace indium in silicate samples by epithernal neutron activation analysis(Abst.) | 31 Symp. Radioch. | 130-131 | M.Ebihara, A.Nemoto and | |
0.0546 | IDMS | 1988.05 | Determination of Ga, In and Tl in standard rock specimens and chondrites by stable isotope dilution | Geoch. J. | 21 | 237-245 | T.Saito, H.Shimizu and A.Masuda |
0.056 | AA | 2001 | Determination of indium and tellurium in sixty one geological reference materias by solvent extraction graphite furnance atomic absorption spectrometry | Geostandards Newsletter | 25 | 127-132 | S.Terashima |