| value | technique | year | title_of_literature<MAX120col.> | journal<MAX120col.> | vol | page | name<MAX80col.> |
| 5.64 | NAA |
1981.1 | Personal communication, Coverment Industrial Research Institute Nagoya, Japan | | | | T.Kawashima |
| 6.5500 | AA |
1984.03 | Personal communication, Government Industrial Research Institute, Chugoku, Japan | | | | S.Hirata |
| 6.64 | XRF |
1983 | Determination of multi elements in sediments by X-ray fluorescence | Annual Rep. Yokohama Res. Inst. for Env. Sci. | 8 | 103-110 | Y.Shirayanagi |
| 6.72 | AA |
1975.04 | Personal communication, Res. Center Jujo Paper Co. Ltd., Japan | | | | M.Tuchiya |
| 4.60 | XRF |
1975.09 | Personal communicatin, Kochi Pref. Res. Center Env. Prot., Japan | | | | J.Yamamoto |
| 6.638 | XRF |
1978.04 | Multi-element analyses of rock and sediment samples by non-dispersive X-ray fluorescence (in Japanese with English abstract) | Bunseki Kagaku | 27 | 193-198 | T.Takamatsu |
| 6.4357 | AA |
1981.07 | Personal communication, Yamagata University, Japan | | | | Y.Honma |
| 6.3891 | SIMS |
1989.1 | Quantitative SIMS of rock reference samples | Geoch. J. | 23 | 215-236 | H.Yurimoto, A.Yamashita, N.Nishida and S.Sueno |
| 6.87 | EXRF |
1979 | Multi-element analysis of geological samples by energy-dispersive X-ray fluorescence | Anal. Chim. Acta | 109 | 85-95 | P.Verbeke and F.Adams |
| 6.9600 | EXRF |
1979 | Soil analysis by thin-film energy-dispersive X-ray fluorescence | Anal. Chim. Acta | 108 | 93-101 | R.V.Grieken, L.Van Dack, |
| 6.25 | PIXE |
1986 | Analysis of geological standards with PIXE and PIGE technioues applications to volcanic rocks | J. Radio. Nuc. Chem., Articles | 102 | 131-141 | I.Brissaud, A.de Chateau-Thierry, J.P.Frontier and |
| 7.43 | INAA |
1996 | Multi-element determination by a cold neutron-induced prompt gamma-ray analysis | | 12 | | C.Yonezawa |