value | technique | year | title_of_literature<MAX120col.> | journal<MAX120col.> | vol | page | name<MAX80col.> |
---|---|---|---|---|---|---|---|
5.64 | NAA | 1981.1 | Personal communication, Coverment Industrial Research Institute Nagoya, Japan | T.Kawashima | |||
6.5500 | AA | 1984.03 | Personal communication, Government Industrial Research Institute, Chugoku, Japan | S.Hirata | |||
6.64 | XRF | 1983 | Determination of multi elements in sediments by X-ray fluorescence | Annual Rep. Yokohama Res. Inst. for Env. Sci. | 8 | 103-110 | Y.Shirayanagi |
6.72 | AA | 1975.04 | Personal communication, Res. Center Jujo Paper Co. Ltd., Japan | M.Tuchiya | |||
4.60 | XRF | 1975.09 | Personal communicatin, Kochi Pref. Res. Center Env. Prot., Japan | J.Yamamoto | |||
6.638 | XRF | 1978.04 | Multi-element analyses of rock and sediment samples by non-dispersive X-ray fluorescence (in Japanese with English abstract) | Bunseki Kagaku | 27 | 193-198 | T.Takamatsu |
6.4357 | AA | 1981.07 | Personal communication, Yamagata University, Japan | Y.Honma | |||
6.3891 | SIMS | 1989.1 | Quantitative SIMS of rock reference samples | Geoch. J. | 23 | 215-236 | H.Yurimoto, A.Yamashita, N.Nishida and S.Sueno |
6.87 | EXRF | 1979 | Multi-element analysis of geological samples by energy-dispersive X-ray fluorescence | Anal. Chim. Acta | 109 | 85-95 | P.Verbeke and F.Adams |
6.9600 | EXRF | 1979 | Soil analysis by thin-film energy-dispersive X-ray fluorescence | Anal. Chim. Acta | 108 | 93-101 | R.V.Grieken, L.Van Dack, |
6.25 | PIXE | 1986 | Analysis of geological standards with PIXE and PIGE technioues applications to volcanic rocks | J. Radio. Nuc. Chem., Articles | 102 | 131-141 | I.Brissaud, A.de Chateau-Thierry, J.P.Frontier and |
7.43 | INAA | 1996 | Multi-element determination by a cold neutron-induced prompt gamma-ray analysis | 12 | C.Yonezawa |