The Universal Sample Holders of Microanalytical Instruments of FIB, TEM, NanoSIMS, and STXM-NEXAFS for the Coordinated Analysis of Extraterrestrial Materials (abs.)

Geological Literature Search (GEOLIS) (Geological Survey of Japan / AIST)

The Universal Sample Holders of Microanalytical Instruments of FIB, TEM, NanoSIMS, and STXM-NEXAFS for the Coordinated Analysis of Extraterrestrial Materials (abs.)

Authors=Motoo Ito, Naotaka Tomioka, Kentaro Uesugi, Masayuki Uesugi, Yu Kodama, Ikuya Sakuraki, Ikuo Okada, Takuji Ohigashi, Hayato Yuzawa, Akira Yamaguchi, Naoya Imae, Yuzuru Karouji, Naoki Shirai, Toru Yada, Masanao Abe

Journal/Book_names=Annual Meeting of the Geochemical Society of Japan (online)

volume=67

pages=G9-PR0068

Publish_year=2020

Publisher=Geochemical Society of Japan

Language_of_Text=EN

DOI=10.14862/geochemproc.67.0_149

ID=300019406

@id=https://gbank.gsj.jp/ld/resource/geolis/300019406