Study on high-resolution technique using full-wave data acquired by refraction measurement layout

Authors=MATSUOKA Toshifumi, SANADA Yoshinori, O'NEILL Adam John, KAMEI Rie, HASEGAWA Nobusuke, KAGAWA Toshiyuki

Journal/Book_names=Proceedings of the SEGJ Conference

volume=111

pages=81-84

Publish_year=2004

Publish_Country=JPN

Publisher=The Society of Exploration Geophysicists of Japan

Language_of_Text=JA

Language_of_Abs=EN

ID=200411608