A fundamental study on the shallow resistivity mapping technique using capacitive electrodes

Authors=HASEGAWA Nobusuke, SHIMA Hiromasa

Journal/Book_names=Proceedings of SEGJ Conference

volume=92

pages=414-417

Publish_year=1995

Publish_Country=JPN

Publisher=The Society of Exploration Geophysicists of Japan

Language_of_Text=JA

ID=199500960